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Home arrow SVTechie Blog
90nm Process Technology Highlights PDF Print E-mail
Written by SVTechie   
Friday, 28 April 2006

Highlights from 90nm Technology Talk(Sponsored by Open Silicon, Synopsys, and TSMC)

  • Synopsys Design Starts Data in 65 nm & 90 nm
  • Currently 600 90nm Designs/Q with about 200 tapeouts/Q
  • 90nm designs are now about 1/3 of total Design Starts of 6k/year
  • 160 65nm Designs/quarter
  • Cutting Edge Design Starts 3k/year!!    
  • 65nm Design Costs
  • R&D 11.7%
  • Reticules 1%
  • Manufacturing costs 87%
  • Total cost $337.650 Million.. Ouch!!
Successfully Design @ 90nm requires  tremendous amount of time and $$. Read More....

TSMC now releases their low power process before their speed process because of the consumer market demands for low power

  • Customers Reasons for going to 90nm
  • Economics $/gate
  • Integration (low product power)
  • Performance (speed)

Because of the consumer market, low power is now the most important reason to use 90nm with increased integration next.

  • 90 nm improvements over 130 nm
  • Area 30%
  • Power 40%
  • Performance 20%
However, all of the 90nm advantages can evaporate because of the additional DFM issues that must be analyzed and prevented such as high pitch interconnect to reduce intra wire capacitance.

  • Power challenges @ 90nm
  • Increase in leakage power
  • Increase in switching currents
  • Power Density/Hot Spots
Biggest impact on reducing power is at the architectural level.

  • Interesting DFY issues @ 90nm
  • Particles- random defects- spread wires within critical areas
  • VIAs- opens due to opening size (mask), and depth (CMP)
  • CMP- non planar causes a bowl shape resulting in vias not making connection between metal
  • Lithography- biggest effect due to using 193nm steppers at 90nm, and having to add OPC and PSM to correct
  • Variations- sum of all other effects that cannot be measured. Usually covered by sandbagging = pessimistic design
  • Strain- manufacturing step that is a proximity effect of length of diffusion reducing effective mobility which in turn impacts the transistors overall electrical parameters.
  • TSMC since 2004 has completed 130 tape outs @ 90nm. Growth rate – 2x/year
  • Defect density must be less than 0.2% to reach production status.
  • TSMC area comparisons- 90nm 419k gates/mm^2, 130nm 219k gates/mm^2 

Successfully Design @ 90nm requires  tremendous amount of time and $$.

Last Updated ( Friday, 28 April 2006 )
 
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