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90nm Process Technology Highlights |
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Written by SVTechie
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Friday, 28 April 2006 |
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Highlights from 90nm Technology Talk(Sponsored by Open
Silicon, Synopsys, and TSMC)
- Synopsys Design Starts Data in 65 nm & 90 nm
- Currently 600 90nm Designs/Q
with about 200 tapeouts/Q
- 90nm designs are now about 1/3 of
total Design Starts of 6k/year
- 160 65nm Designs/quarter
- Cutting Edge Design Starts 3k/year!!
- R&D 11.7%
- Reticules 1%
- Manufacturing costs 87%
- Total cost $337.650 Million.. Ouch!!
Successfully Design @ 90nm requires tremendous amount of time and $$. Read More....
TSMC now releases their low power process before their
speed process because of the consumer market demands for low power
- Customers Reasons for going to 90nm
- Economics $/gate
- Integration (low product power)
- Performance (speed)
Because of the consumer market, low power is now the most important
reason to use 90nm with increased integration next.
- 90 nm improvements over 130 nm
- Area 30%
- Power 40%
- Performance 20%
However, all of the 90nm advantages can evaporate because
of the additional DFM issues that must be analyzed and prevented such as high
pitch interconnect to reduce intra wire capacitance.
- Increase in leakage power
- Increase in switching currents
- Power Density/Hot Spots
Biggest impact on reducing power is at the architectural level.
- Interesting DFY
issues @ 90nm
- Particles-
random defects- spread wires within critical areas
- VIAs- opens
due to opening size (mask), and depth (CMP)
- CMP- non
planar causes a bowl shape resulting in vias not making connection between
metal
- Lithography-
biggest effect due to using 193nm steppers at 90nm, and having to add OPC and
PSM to correct
- Variations-
sum of all other effects that cannot be measured. Usually covered by
sandbagging = pessimistic design
- Strain-
manufacturing step that is a proximity effect of length of diffusion reducing
effective mobility which in turn impacts the transistors overall electrical parameters.
- TSMC since 2004 has completed 130 tape outs @ 90nm. Growth
rate – 2x/year
- Defect density must be less than 0.2% to reach production
status.
- TSMC area comparisons- 90nm 419k gates/mm^2, 130nm 219k
gates/mm^2
Successfully Design @ 90nm requires tremendous amount of time and $$.
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Last Updated ( Friday, 28 April 2006 )
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